DB HiTek announced that the company has developed a 110-nanometer-based global shutter (global shutter) and single-photon avalanche diode (SPAD: single-photon avalanche diode) process, and will expand its image sensor market.
The global shutter senses image information from all pixels simultaneously, enabling accurate video and image recording without distortion, even when shooting fast-moving subjects. In addition, the global shutter enables highly accurate identification of object shapes. Recently, the global shutter has been widely used in industrial machine vision, in addition to various applications such as automobiles, drones, and cameras for machine vision inspection.
DB HiTek’s global shutter is based on 110nm BSI process, and uses light shield and light guide technology. It has 99.99% Global Shutter Efficiency (GSE) performance and can support multiple pixel sizes down to 2.8um.
Single-photon avalanche diode (SPAD) is a sensing technology that can detect weak light signals at the single-photon level. SPAD measures the distance to the object by identifying the time-of-flight (ToF) of light reflected from an object reaching the sensor. With the advantages of long distance and high precision, SPAD is actively used in the field of automotive LiDAR or ToF, and is also suitable for various applications such as smartphones, AR/VR wearables, surveillance cameras and industrial machine vision.
Based on the 110nm FSI process, DB HiTek ensures a photon detection probability (PDP) performance of 3.8% @905nm. The company also plans to implement the BSI process and complete the development of the PDP 7%@905nm within this year.
In order to assist fabless customers to enter the market on time and improve product competitiveness, DB HiTek will provide MPW (multi project wafer) services dedicated to global shutter and SPAD operations in September this year.